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/test/vts/tools/build/tasks/list/
Dvts_test_lib_hal_package_list.mk17 android.hardware.tests.libbinder \
18 android.hardware.tests.libhwbinder@1.0 \
19 android.hardware.tests.libhwbinder@1.0-impl \
20 android.hardware.tests.bar@1.0 \
21 android.hardware.tests.bar@1.0-impl \
22 android.hardware.tests.baz@1.0 \
23 android.hardware.tests.baz@1.0-impl \
24 android.hardware.tests.expression@1.0 \
25 android.hardware.tests.foo@1.0 \
26 android.hardware.tests.foo@1.0-impl \
[all …]
Dvts_adapter_package_list.mk173 android.hardware.tests.bar@1.0-adapter \
174 android.hardware.tests.bar@1.0-adapter-helper \
175 android.hardware.tests.baz@1.0-adapter \
176 android.hardware.tests.baz@1.0-adapter-helper \
177 android.hardware.tests.expression@1.0-adapter \
178 android.hardware.tests.expression@1.0-adapter-helper \
179 android.hardware.tests.extension.light@2.0-adapter \
180 android.hardware.tests.extension.light@2.0-adapter-helper \
181 android.hardware.tests.foo@1.0-adapter \
182 android.hardware.tests.foo@1.0-adapter-helper \
[all …]
Dvts_test_bin_package_list.mk17 android.hardware.tests.msgq@1.0-service-benchmark \
18 android.hardware.tests.msgq@1.0-service-test \
47 ion-unit-tests \
/test/vts/tools/vts-tradefed/res/config/
Dplans.md3 A VTS test plan consists of a set of VTS tests. Typically the tests within a
10 Official plans contain only verified tests, and are for all Android developers
13 * __vts__: For all default VTS tests.
14 * __vts-firmware__: For all default VTS System Firmware tests.
15 * __vts-fuzz__: For all default VTS fuzz tests.
16 * __vts-hal__: For all default VTS HAL (hardware abstraction layer) module tests.
17 * __vts-hal-profiling__: For all default VTS HAL performance profiling tests.
18 * __vts-hal-replay__: For all default VTS HAL replay tests.
19 * __vts-kernel__: For all default VTS kernel tests.
20 * __vts-library__: For all default VTS library tests.
[all …]
/test/vts/compilation_tools/vtsc/test/golden/DRIVER/
DBar.vts.h35 using namespace android::hardware::tests::bar::V1_0;
38 …Related(const VariableSpecificationMessage& var_msg, ::android::hardware::tests::bar::V1_0::IBar::…
40 …ingRelated(VariableSpecificationMessage* result_msg, ::android::hardware::tests::bar::V1_0::IBar::…
42 class Vts_android_hardware_tests_bar_V1_0_IBar : public ::android::hardware::tests::bar::V1_0::IBar…
50 ::android::hardware::tests::foo::V1_0::IFoo::Discriminator arg0,
51 …droid::hardware::tests::foo::V1_0::IFoo::Union>& arg1, std::function<void(const ::android::hardwar…
75 const sp<::android::hardware::tests::foo::V1_0::IFooCallback>& arg0) override;
77 ::android::hardware::Return<::android::hardware::tests::foo::V1_0::IFoo::SomeEnum> useAnEnum(
78 ::android::hardware::tests::foo::V1_0::IFoo::SomeEnum arg0) override;
81 …const ::android::hardware::hidl_vec<::android::hardware::tests::foo::V1_0::IFoo::Goober>& arg0) ov…
[all …]
DTestMsgQ.vts.h23 using namespace android::hardware::tests::msgq::V1_0;
26 …lagBits(const VariableSpecificationMessage& var_msg, ::android::hardware::tests::msgq::V1_0::ITest…
29 …ntFlagBits(VariableSpecificationMessage* result_msg, ::android::hardware::tests::msgq::V1_0::ITest…
31 class Vts_android_hardware_tests_msgq_V1_0_ITestMsgQ : public ::android::hardware::tests::msgq::V1_…
71 sp<::android::hardware::tests::msgq::V1_0::ITestMsgQ> VtsFuzzerCreateVts_android_hardware_tests_msg…
77 …explicit FuzzerExtended_android_hardware_tests_msgq_V1_0_ITestMsgQ(::android::hardware::tests::msg… in FuzzerExtended_android_hardware_tests_msgq_V1_0_ITestMsgQ()
89 sp<::android::hardware::tests::msgq::V1_0::ITestMsgQ> hw_binder_proxy_;
DBar.driver.cpp11 using namespace android::hardware::tests::bar::V1_0;
14 …icationMessage& var_msg __attribute__((__unused__)), ::android::hardware::tests::bar::V1_0::IBar::… in MessageTo__android__hardware__tests__bar__V1_0__IBar__SomethingRelated()
22 …ingRelated(VariableSpecificationMessage* result_msg, ::android::hardware::tests::bar::V1_0::IBar::… in SetResult__android__hardware__tests__bar__V1_0__IBar__SomethingRelated()
37 …hw_binder_proxy_ = ::android::hardware::tests::bar::V1_0::IBar::getService(service_name, get_stub); in GetService()
50 ::android::hardware::tests::foo::V1_0::IFoo::Discriminator arg0 __attribute__((__unused__)), in convertToBoolIfSmall()
51 …e::tests::foo::V1_0::IFoo::Union>& arg1 __attribute__((__unused__)), std::function<void(const ::an… in convertToBoolIfSmall()
68 cb(::android::hardware::hidl_vec<::android::hardware::tests::foo::V1_0::IFoo::ContainsUnion>()); in convertToBoolIfSmall()
181 … const sp<::android::hardware::tests::foo::V1_0::IFooCallback>& arg0 __attribute__((__unused__))) { in callMe()
193 ::android::hardware::Return<::android::hardware::tests::foo::V1_0::IFoo::SomeEnum> Vts_android_hard… in useAnEnum()
194 ::android::hardware::tests::foo::V1_0::IFoo::SomeEnum arg0 __attribute__((__unused__))) { in useAnEnum()
[all …]
DMemoryTest.vts.h27 using namespace android::hardware::tests::memory::V1_0;
31 class Vts_android_hardware_tests_memory_V1_0_IMemoryTest : public ::android::hardware::tests::memor…
59 sp<::android::hardware::tests::memory::V1_0::IMemoryTest> VtsFuzzerCreateVts_android_hardware_tests…
65 …ended_android_hardware_tests_memory_V1_0_IMemoryTest(::android::hardware::tests::memory::V1_0::IMe… in FuzzerExtended_android_hardware_tests_memory_V1_0_IMemoryTest()
77 sp<::android::hardware::tests::memory::V1_0::IMemoryTest> hw_binder_proxy_;
DTestMsgQ.driver.cpp11 using namespace android::hardware::tests::msgq::V1_0;
14 …icationMessage& var_msg __attribute__((__unused__)), ::android::hardware::tests::msgq::V1_0::ITest… in MessageTo__android__hardware__tests__msgq__V1_0__ITestMsgQ__EventFlagBits()
15 …*arg = (::android::hardware::tests::msgq::V1_0::ITestMsgQ::EventFlagBits)var_msg.scalar_value().ui… in MessageTo__android__hardware__tests__msgq__V1_0__ITestMsgQ__EventFlagBits()
19 …if (choice == (uint32_t) 1UL) return static_cast<uint32_t>(::android::hardware::tests::msgq::V1_0:… in Random__android__hardware__tests__msgq__V1_0__ITestMsgQ__EventFlagBits()
20 …if (choice == (uint32_t) 2UL) return static_cast<uint32_t>(::android::hardware::tests::msgq::V1_0:… in Random__android__hardware__tests__msgq__V1_0__ITestMsgQ__EventFlagBits()
21 …return static_cast<uint32_t>(::android::hardware::tests::msgq::V1_0::ITestMsgQ::EventFlagBits::FMQ… in Random__android__hardware__tests__msgq__V1_0__ITestMsgQ__EventFlagBits()
28 …ntFlagBits(VariableSpecificationMessage* result_msg, ::android::hardware::tests::msgq::V1_0::ITest… in SetResult__android__hardware__tests__msgq__V1_0__ITestMsgQ__EventFlagBits()
41 …hw_binder_proxy_ = ::android::hardware::tests::msgq::V1_0::ITestMsgQ::getService(service_name, get… in GetService()
187 sp<::android::hardware::tests::msgq::V1_0::ITestMsgQ> VtsFuzzerCreateVts_android_hardware_tests_msg… in VtsFuzzerCreateVts_android_hardware_tests_msgq_V1_0_ITestMsgQ()
188 static sp<::android::hardware::tests::msgq::V1_0::ITestMsgQ> result; in VtsFuzzerCreateVts_android_hardware_tests_msgq_V1_0_ITestMsgQ()
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/test/mlts/benchmark/
DAndroid.mk23 LOCAL_MODULE_TAGS := tests
24 LOCAL_COMPATIBILITY_SUITE += device-tests
33 GOOGLE_TEST_MODELS_DIR := vendor/google/tests/mlts/models/assets
46 LOCAL_MODULE_TAGS := tests
47 LOCAL_COMPATIBILITY_SUITE += device-tests
56 GOOGLE_TEST_MODELS_DIR := vendor/google/tests/mlts/models/assets
DREADME.txt36 The MLTS suite contains a series of tests to validate the behaviour of the drivers under stress or
39 To run the tests use the specific targets available in the build_and_run_benchmark.sh script.
43 It is also possible to run additional tests without specified target accelerator to let NNAPI
47 Currently available tests are:
53 * parallel-inference-stress-in-process: same as parallel-inference-stress but the tests are running
/test/mts/
DREADME.md7 MTS has mainly three types of tests:
9 * Unit tests
10 * CTS tests
11 * GTS tests
/test/vts/compilation_tools/vtsc/test/golden/PROFILER/
DBar.profiler.cpp7 using namespace android::hardware::tests::bar::V1_0;
15 ::android::hardware::tests::bar::V1_0::IBar::SomethingRelated arg_val_name __attribute__((__unused_… in profile____android__hardware__tests__bar__V1_0__IBar__SomethingRelated()
63 …oid::hardware::tests::foo::V1_0::IFoo::Discriminator *arg_val_0 __attribute__((__unused__)) = rein… in HIDL_INSTRUMENTATION_FUNCTION_android_hardware_tests_bar_V1_0_IBar()
71 …re::tests::foo::V1_0::IFoo::Union> *arg_val_1 __attribute__((__unused__)) = reinterpret_cast<::and… in HIDL_INSTRUMENTATION_FUNCTION_android_hardware_tests_bar_V1_0_IBar()
94 …tests::foo::V1_0::IFoo::ContainsUnion> *result_val_0 __attribute__((__unused__)) = reinterpret_cas… in HIDL_INSTRUMENTATION_FUNCTION_android_hardware_tests_bar_V1_0_IBar()
488 …droid::hardware::tests::foo::V1_0::IFooCallback> *arg_val_0 __attribute__((__unused__)) = reinterp… in HIDL_INSTRUMENTATION_FUNCTION_android_hardware_tests_bar_V1_0_IBar()
534 …ndroid::hardware::tests::foo::V1_0::IFoo::SomeEnum *arg_val_0 __attribute__((__unused__)) = reinte… in HIDL_INSTRUMENTATION_FUNCTION_android_hardware_tests_bar_V1_0_IBar()
552 …roid::hardware::tests::foo::V1_0::IFoo::SomeEnum *result_val_0 __attribute__((__unused__)) = reint… in HIDL_INSTRUMENTATION_FUNCTION_android_hardware_tests_bar_V1_0_IBar()
588 …e::tests::foo::V1_0::IFoo::Goober> *arg_val_0 __attribute__((__unused__)) = reinterpret_cast<::and… in HIDL_INSTRUMENTATION_FUNCTION_android_hardware_tests_bar_V1_0_IBar()
639 …android::hardware::tests::foo::V1_0::IFoo::Goober *arg_val_0 __attribute__((__unused__)) = reinter… in HIDL_INSTRUMENTATION_FUNCTION_android_hardware_tests_bar_V1_0_IBar()
[all …]
DBar.vts.h32 using namespace android::hardware::tests::bar::V1_0;
38 ::android::hardware::tests::bar::V1_0::IBar::SomethingRelated arg_val_name);
DTestMsgQ.vts.h20 using namespace android::hardware::tests::msgq::V1_0;
26 ::android::hardware::tests::msgq::V1_0::ITestMsgQ::EventFlagBits arg_val_name);
/test/vts/script/
Dpip_requirements.txt16 # Required packages for Camera ITS tests
22 # Required packages for Kernel tests
26 # Required packages for USB gadget tests
29 # Required packages for unit tests
Drun_cts_with_profiling.sh56 tests=()
59 tests+=($test)
63 for i in ${tests[@]}
/test/framework/build/
Dvtf.mk21 compatibility-common-util-tests \
23 compatibility-host-util-tests \
24 compatibility-tradefed-tests \
30 vts10-tradefed-tests \
/test/vts-testcase/nbu/src/
DREADME.md3 This suite includes tests that exercises Android connectivity APIs and verify
8 These tests simulate connectivity use cases critical to NBU market like
11 We created these tests using tools from the open source project Mobly, if you
15 The tests have two components, an agent apk running on the Android Device Under
17 connected via USB. The tests issue cmds to the agent on the device to trigger
20 The tests by default write output to `/tmp/logs`.
25 these tests.
/test/suite_harness/common/host-side/tradefed/tests/src/com/android/compatibility/common/tradefed/testtype/retry/
DRetryFactoryTestTest.java82 List<IRemoteTest> tests = new ArrayList<>(); in split() local
84 tests.add(new StubTest()); in split()
86 return tests; in split()
94 LinkedHashMap<String, IConfiguration> tests = new LinkedHashMap<>(); in loadTests() local
97 tests.put("module1", config); in loadTests()
98 return tests; in loadTests()
/test/vts/testcases/template/param_test/
Dparam_test.py97 tests = [(str(test_name + self.getParamTag(param)), test_func)
102 for test_name, _ in tests
104 self.runTestsWithRetry(tests)
/test/mlts/benchmark/dogfood/
DAndroid.mk24 LOCAL_MODULE_TAGS := tests
25 LOCAL_COMPATIBILITY_SUITE += device-tests
37 GOOGLE_TEST_MODELS_DIR := vendor/google/tests/mlts/models/assets
/test/mlts/benchmark/crashtest/
DAndroid.mk24 LOCAL_MODULE_TAGS := tests
25 LOCAL_COMPATIBILITY_SUITE += device-tests
40 GOOGLE_TEST_MODELS_DIR := vendor/google/tests/mlts/models/assets
/test/vts-testcase/kernel/ltp/
Denvironment_requirement_checker.py86 for rule, tests in
88 if test_case.fullname in tests)
91 for rule, tests in
93 if test_case.testsuite in tests)
/test/vts/tools/build/
DAndroid.bp1 // Common build rules for VTS tests
7 // test_suites: ["general-tests"],

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